Invention Grant
US09036896B2 Inspection system and method for inspecting line width and/or positional errors of a pattern
有权
用于检查图案的线宽和/或位置误差的检查系统和方法
- Patent Title: Inspection system and method for inspecting line width and/or positional errors of a pattern
- Patent Title (中): 用于检查图案的线宽和/或位置误差的检查系统和方法
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Application No.: US13083157Application Date: 2011-04-08
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Publication No.: US09036896B2Publication Date: 2015-05-19
- Inventor: Takanao Touya , Shuichi Tamamushi , Hidenori Sato , Hiroyuki Tanizaki , Takeshi Fujiwara , Eiji Sawa , Kentaro Okuda , Hiroyuki Ikeda , Hiromu Inoue , Hiroshi Tsukada
- Applicant: Takanao Touya , Shuichi Tamamushi , Hidenori Sato , Hiroyuki Tanizaki , Takeshi Fujiwara , Eiji Sawa , Kentaro Okuda , Hiroyuki Ikeda , Hiromu Inoue , Hiroshi Tsukada
- Applicant Address: JP Numazu-shi JP Tokyo
- Assignee: NuFlare Technology, Inc.,Kabushiki Kaisha Toshiba
- Current Assignee: NuFlare Technology, Inc.,Kabushiki Kaisha Toshiba
- Current Assignee Address: JP Numazu-shi JP Tokyo
- Agency: Oblon, McClelland, Maier & Neustadt, L.L.P.
- Priority: JP2010-090057 20100409
- Main IPC: G06K9/00
- IPC: G06K9/00 ; G06T7/00

Abstract:
A method and system for imaging an object to be inspected and obtaining an optical image; creating a reference image from design pattern data; preparing an inspection recipe including one or more templates and parameter settings necessary for the inspection; checking the pattern and the template against each other, and selecting the reference image which corresponds to the template; detecting first and second edges in the selected reference image in accordance with the parameter setting using determined coordinates as a reference; detecting first and second edges in the optical image, this optical image corresponds to the selected reference image; and determining an inspection value by acquiring the difference between the line width of the optical image and the reference image using the first edge and second edge of the reference image and the first edge and second edges of the optical image.
Public/Granted literature
- US20110255770A1 INSPECTION SYSTEM AND METHOD FOR INSPECTING LINE WIDTH AND/OR POSITIONAL ERRORS OF A PATTERN Public/Granted day:2011-10-20
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