Invention Grant
- Patent Title: Memory device with background built-in self-testing and background built-in self-repair
- Patent Title (中): 内存设备背景内置自检和背景内置自修复
-
Application No.: US13732783Application Date: 2013-01-02
-
Publication No.: US09037928B2Publication Date: 2015-05-19
- Inventor: Bendik Kleveland , Dipak K Sikdar , Rajesh Chopra , Jay Patel
- Applicant: Bendik Kleveland , Dipak K Sikdar , Rajesh Chopra , Jay Patel
- Applicant Address: US CA Santa Clara
- Assignee: MoSys, Inc.
- Current Assignee: MoSys, Inc.
- Current Assignee Address: US CA Santa Clara
- Agency: MoSys, Inc. (crn)
- Main IPC: G06F11/20
- IPC: G06F11/20 ; G11C29/44 ; G11C29/16 ; G06F11/10 ; G11C29/12 ; G11C29/06 ; G11C29/04
Abstract:
A memory device with background built-in self-testing (BBIST) includes a plurality of memory blocks; a memory buffer to offload data from one of the plurality of memory blocks temporarily; and a memory block stress controller to control a stress test applied to the one of the memory blocks when the data is temporarily offloaded on the memory buffer. The stress test tests for errors in the one of the plurality of the memory blocks.
Public/Granted literature
- US20130173970A1 MEMORY DEVICE WITH BACKGROUND BUILT-IN SELF-TESTING AND BACKGROUND BUILT-IN SELF-REPAIR Public/Granted day:2013-07-04
Information query
