Invention Grant
US09038006B2 Method and apparatus for generating gate-level activity data for use in clock gating efficiency analysis
有权
用于产生门级活动数据的方法和装置,用于时钟选通效率分析
- Patent Title: Method and apparatus for generating gate-level activity data for use in clock gating efficiency analysis
- Patent Title (中): 用于产生门级活动数据的方法和装置,用于时钟选通效率分析
-
Application No.: US13874477Application Date: 2013-04-30
-
Publication No.: US09038006B2Publication Date: 2015-05-19
- Inventor: Lior Moheban , Asher Berkovitz , Guy Shmueli
- Applicant: FREESCALE SEMICONDUCTOR, INC.
- Applicant Address: US TX Austin
- Assignee: Freescale Semiconductor, Inc.
- Current Assignee: Freescale Semiconductor, Inc.
- Current Assignee Address: US TX Austin
- Main IPC: G06F17/50
- IPC: G06F17/50

Abstract:
A mechanism for generating gate-level activity data for use in clock gating efficiency analysis of an integrated circuit (IC) design is provided. Generating the gate-level activity data includes generating a signal behaviour description for inter-register signals, generating a gate-level netlist for the IC design, generating gate-level stimuli based at least partly on the generated signal behaviour description, and performing gate-level simulation using the generated gate-level stimuli to generate gate-level activity data for the IC design. In one embodiment, generating the signal behaviour description includes performing Register Transfer Level (RTL) simulation of the IC design, and generating the gate-level netlist includes performing RTL synthesis. The RTL simulation and RTL synthesis are performed on RTL data for the IC design.
Public/Granted literature
- US20140325461A1 METHOD AND APPARATUS FOR GENERATING GATE-LEVEL ACTIVITY DATA FOR USE IN CLOCK GATING EFFICIENCY ANALYSIS Public/Granted day:2014-10-30
Information query