Invention Grant
- Patent Title: Method for manufacturing semiconductor device
- Patent Title (中): 制造半导体器件的方法
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Application No.: US13676717Application Date: 2012-11-14
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Publication No.: US09040426B2Publication Date: 2015-05-26
- Inventor: Masatoshi Koyama , Kazuaki Matsuura , Tsutomu Komatani
- Applicant: SUMITOMO ELECTRIC DEVICE INNOVATIONS, INC.
- Applicant Address: JP Yokohama-shi
- Assignee: SUMITOMO ELECTRIC DEVICE INNOVATIONS, INC.
- Current Assignee: SUMITOMO ELECTRIC DEVICE INNOVATIONS, INC.
- Current Assignee Address: JP Yokohama-shi
- Agency: Westerman, Hattori, Daniels & Adrian, LLP
- Priority: JP2011-248817 20111114
- Main IPC: H01L21/302
- IPC: H01L21/302 ; H01L29/66 ; H01L21/02 ; H01L29/778 ; H01L29/06 ; H01L29/20 ; H01L29/417

Abstract:
A method for manufacturing a semiconductor device includes: forming a first active region, a second active region, an inactive region located between the first active region and the second active region, and a third active region, which crosses the inactive region to electrically connect the first active region to the second active region, in a semiconductor layer; forming an insulating layer on the semiconductor layer; and forming an opening selectively in the insulating layer by dry etching.
Public/Granted literature
- US20130122669A1 METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE Public/Granted day:2013-05-16
Information query
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