Invention Grant
US09041928B2 Feature value estimation device and corresponding method, and spectral image processing device and corresponding method
有权
特征值估计装置及相应方法，以及光谱图像处理装置及其对应方法
- Patent Title: Feature value estimation device and corresponding method, and spectral image processing device and corresponding method
- Patent Title (中): 特征值估计装置及相应方法，以及光谱图像处理装置及其对应方法
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Application No.: US13472047Application Date: 2012-05-15
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Publication No.: US09041928B2Publication Date: 2015-05-26
- Inventor: Masashi Kanai , Yoshifumi Arai
- Applicant: Masashi Kanai , Yoshifumi Arai
- Applicant Address: JP Tokyo
- Assignee: SEIKO EPSON CORPORATION
- Current Assignee: SEIKO EPSON CORPORATION
- Current Assignee Address: JP Tokyo
- Agency: Oliff PLC
- Priority: JP2011-113483 20110520
- Main IPC: G01J3/46
- IPC: G01J3/46 ; G01N33/02 ; G01N21/25 ; G01N21/27 ; G01N21/31
Abstract:
An estimation device is configured to estimate a feature value of a specific component contained in a sample and includes: a spectral estimation parameter storage module; a calibration parameter storage module; a multiband image acquirer; an optical spectrum operator configured to compute an optical spectrum from a multiband image using a spectral estimation parameter; and a calibration processor configured to compute the feature value from the optical spectrum using a calibration parameter.
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