Invention Grant
- Patent Title: Program and read trim setting
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Application No.: US13158826Application Date: 2011-06-13
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Publication No.: US09042178B2Publication Date: 2015-05-26
- Inventor: Seiichi Aritome
- Applicant: Seiichi Aritome
- Applicant Address: US ID Boise
- Assignee: Micron Technology, Inc.
- Current Assignee: Micron Technology, Inc.
- Current Assignee Address: US ID Boise
- Agency: Dicke, Billig & Czaja, PLLC
- Main IPC: G11C11/34
- IPC: G11C11/34 ; G11C16/10
Abstract:
A method and apparatus for setting trim parameters in a memory device provides multiple trim settings that are assigned to portions of the memory device according to observed or tested programming speed and reliability.
Public/Granted literature
- US20110242897A1 PROGRAM AND READ TRIM SETTING Public/Granted day:2011-10-06
Information query
