Invention Grant
- Patent Title: X-ray imaging apparatus
- Patent Title (中): X射线成像装置
-
Application No.: US13643260Application Date: 2011-04-19
-
Publication No.: US09042517B2Publication Date: 2015-05-26
- Inventor: Kazunori Fukuda , Kazuhiro Takada , Taihei Mukaide , Masatoshi Watanabe
- Applicant: Kazunori Fukuda , Kazuhiro Takada , Taihei Mukaide , Masatoshi Watanabe
- Applicant Address: JP Tokyo
- Assignee: Canon Kabushiki Kaisha
- Current Assignee: Canon Kabushiki Kaisha
- Current Assignee Address: JP Tokyo
- Agency: Canon USA Inc. IP Division
- Priority: JP2010-102527 20100427
- International Application: PCT/JP2011/060009 WO 20110419
- International Announcement: WO2011/136157 WO 20111103
- Main IPC: G01N23/04
- IPC: G01N23/04

Abstract:
To provide an X-ray imaging apparatus capable of easily adjusting the sensitivity or capable of easily extracting the amount of refraction of X-rays.An X-ray imaging apparatus irradiating an object to be measured with an X-ray beam from an X-ray source that generates X-rays of a first energy and X-rays of a second energy different from the first energy to measure an image of the object to be measured includes an attenuator and a detector. The attenuator attenuates the X-ray beam transmitted through the object to be measured and is configured so as to vary the amount of attenuation of the X-rays depending on a position on which the X-ray beam is incident. The detector detects the X-ray beam transmitted through the attenuator and is configured so as to detect the X-rays of the first energy and the second energy.
Public/Granted literature
- US20130039466A1 X-RAY IMAGING APPARATUS Public/Granted day:2013-02-14
Information query