Invention Grant
- Patent Title: Stochastic reflectometer
- Patent Title (中): 随机反射计
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Application No.: US13557843Application Date: 2012-07-25
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Publication No.: US09042721B2Publication Date: 2015-05-26
- Inventor: Sebastian Randel , Jeffrey H. Sinsky
- Applicant: Sebastian Randel , Jeffrey H. Sinsky
- Applicant Address: FR Boulogne-Billancourt
- Assignee: Alcatel Lucent
- Current Assignee: Alcatel Lucent
- Current Assignee Address: FR Boulogne-Billancourt
- Agency: Mendelsohn, Drucker & Dunleavy, P.C.
- Agent Yuri Gruzdkov
- Main IPC: H04B10/071
- IPC: H04B10/071 ; G01M11/00

Abstract:
Disclosed herein are various embodiments of a time-domain reflectometer having a transmitter configured to apply, to a system under test (SUT), an intensity-modulated probe signal generated based on a periodic pseudo-random bit sequence. The reflectometer further has a receiver configured to receive, back from the SUT, a reflected signal corresponding to the probe signal. The receiver converts the received reflected signal into a binary bit sequence using a relatively simple slicer circuit, and without the use of complex analog circuits and/or multi-bit analog-to-digital converters. The binary bit sequence is then compared with the original pseudo-random bit sequence to obtain a measure of the impulse response of the SUT. In some embodiments, the reflectometer has a controllable noise generator that can be used, e.g., to optimize the obtained measure for the detection of multiple SUT defects having significantly differing reflection characteristics.
Public/Granted literature
- US20140029932A1 STOCHASTIC REFLECTOMETER Public/Granted day:2014-01-30
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