Invention Grant
- Patent Title: Abnormality determination apparatus for angle detection device
- Patent Title (中): 角度检测装置异常确定装置
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Application No.: US13307346Application Date: 2011-11-30
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Publication No.: US09043165B2Publication Date: 2015-05-26
- Inventor: Takahumi Oowada
- Applicant: Takahumi Oowada
- Applicant Address: JP Kariya
- Assignee: DENSO CORPORATION
- Current Assignee: DENSO CORPORATION
- Current Assignee Address: JP Kariya
- Agency: Nixon & Vanderhye PC
- Priority: JP2010-268414 20101201; JP2011-228458 20111018
- Main IPC: G01D5/20
- IPC: G01D5/20 ; G01D5/244

Abstract:
The abnormality determination apparatus, which is for determining presence of an abnormality in an angle detection device configured to output an output signal having a value equivalent to a rotational angle of a rotating body, includes a smoothing device configured to receive the output signal of the angle detection device to smooth a dependent variable of a function whose independent variable is the rotational angle equivalent value, and a parameter calculation device for calculating an abnormality determination parameter based on the dependent variable smoothed by the smoothing device. The function is such that an integrated value of the rotational angle equivalent value over a predetermined time section is always positive or negative, and is configured to vary the dependent variable continuously in accordance with continuous variation of the independent variable in at least a part of the predetermined time section.
Public/Granted literature
- US20120143520A1 ABNORMALITY DETERMINATION APPARATUS FOR ANGLE DETECTION DEVICE Public/Granted day:2012-06-07
Information query
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