Invention Grant
US09043518B2 Method and apparatus for calibrating a memory interface with a number of data patterns
有权
用于校准具有多个数据模式的存储器接口的方法和装置
- Patent Title: Method and apparatus for calibrating a memory interface with a number of data patterns
- Patent Title (中): 用于校准具有多个数据模式的存储器接口的方法和装置
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Application No.: US14164299Application Date: 2014-01-27
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Publication No.: US09043518B2Publication Date: 2015-05-26
- Inventor: Terry M. Grunzke
- Applicant: Micron Technology, Inc.
- Applicant Address: US ID Boise
- Assignee: Micron Technology, Inc.
- Current Assignee: Micron Technology, Inc.
- Current Assignee Address: US ID Boise
- Agency: Brooks, Cameron & Huebsch, PLLC
- Main IPC: G06F12/00
- IPC: G06F12/00 ; G06F3/00 ; G06F3/06 ; G06F13/16

Abstract:
Apparatuses and methods of calibrating a memory interface are described. Calibrating a memory interface can include loading and outputting units of a first data pattern into and from at least a portion of a register to generate a first read capture window. Units of a second data pattern can be loaded into and output from at least the portion of the register to generate a second read capture window. One of the first read capture window and the second read capture window can be selected and a data capture point for the memory interface can be calibrated according to the selected read capture window.
Public/Granted literature
- US20140229687A1 METHOD AND APPARATUS FOR CALIBRATING A MEMORY INTERFACE WITH A NUMBER OF DATA PATTERNS Public/Granted day:2014-08-14
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