Invention Grant
- Patent Title: Error protection for integrated circuits
- Patent Title (中): 集成电路的误差保护
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Application No.: US13747896Application Date: 2013-01-23
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Publication No.: US09043683B2Publication Date: 2015-05-26
- Inventor: William V. Huott , Kevin W. Kark , John G. Massey , K. Paul Muller , David L. Rude , David S. Wolpert
- Applicant: International Business Machines Corporation
- Applicant Address: US NY Armonk
- Assignee: International Business Machines Corporation
- Current Assignee: International Business Machines Corporation
- Current Assignee Address: US NY Armonk
- Agency: Cantor Colburn LLP
- Agent William A. Kinnaman, Jr.
- Main IPC: H03M13/00
- IPC: H03M13/00 ; H03M13/29 ; H03M13/05

Abstract:
A method for providing error detection and/or correction to an array of storage cells includes determining a sensitive direction and an insensitive direction of the storage cells and adding a first error control mechanism to the array of storage cells in the insensitive direction. The method also includes adding a second error control mechanism to the array of storage cells in the sensitive direction. The second error control mechanism has a higher Hamming distance than the first error control mechanism.
Public/Granted literature
- US20140208184A1 ERROR PROTECTION FOR INTEGRATED CIRCUITS Public/Granted day:2014-07-24
Information query
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