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US09043946B2 Method for measuring the near-field signal 有权
近场信号测量方法

  • Patent Title: Method for measuring the near-field signal
  • Patent Title (中): 近场信号测量方法
  • Application No.: US14349801
    Application Date: 2012-12-19
  • Publication No.: US09043946B2
    Publication Date: 2015-05-26
  • Inventor: Nenad Ocelic
  • Applicant: Neaspec GmbH
  • Applicant Address: DE Martinsried
  • Assignee: Neaspec GmbH
  • Current Assignee: Neaspec GmbH
  • Current Assignee Address: DE Martinsried
  • Agency: Smith Patent
  • Agent Chalin A. Smith
  • Priority: EP12150325 20120105
  • International Application: PCT/EP2012/076068 WO 20121219
  • International Announcement: WO2013/102561 WO 20130711
  • Main IPC: G01Q60/18
  • IPC: G01Q60/18 ;  H04B5/00 ;  G01N21/47
Method for measuring the near-field signal
Abstract:
The present invention relates to a method for measuring the near-field signal of a sample in a scattering type near-field microscope and to a device for conducting said method.
Abstract(Chinese):

本发明涉及一种用于测量散射型近场显微镜中的样品的近场信号的方法以及用于进行所述方法的装置。

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