Invention Grant
- Patent Title: X-ray imaging apparatus
- Patent Title (中): X射线成像装置
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Application No.: US13641966Application Date: 2011-05-20
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Publication No.: US09046466B2Publication Date: 2015-06-02
- Inventor: Chidane Ouchi
- Applicant: Chidane Ouchi
- Applicant Address: JP Tokyo
- Assignee: CANON KABUSHIKI KAISHA
- Current Assignee: CANON KABUSHIKI KAISHA
- Current Assignee Address: JP Tokyo
- Agency: Fitzpatrick, Cella, Harper & Scinto
- Priority: JP2010-121225 20100527
- International Application: PCT/JP2011/062149 WO 20110520
- International Announcement: WO2011/149033 WO 20111201
- Main IPC: G03H5/00
- IPC: G03H5/00 ; G01N23/20 ; G01B9/021 ; G03H1/10 ; G01N23/04 ; G01J9/02 ; A61B6/00 ; G02B5/18 ; G01J9/00 ; G21K1/06 ; G01B11/25

Abstract:
Provided is an X-ray imaging apparatus having simple configuration and obtaining differential phase contrast images in two directions crossing each other without rotating the diffraction grating and the masking grating. The apparatus including: a diffraction grating diffracting X-rays; a masking grating masking portions rays and transmitting portions are two-dimensionally arranged to partially mask bright zones of the interference pattern; a moving device changing the relative position between the interference pattern and the masking grating; a detector detecting the intensity distribution of the X-rays transmitted through the masking grating; and a calculator calculating a differential phase contrast image or a phase contrast image of a subject, the calculator being configured to calculate the differential phase contrast image or the phase contrast image in each of two mutually crossing directions on the basis of results of detection performed a plurality of times by the detector.
Public/Granted literature
- US20130034209A1 X-RAY IMAGING APPARATUS Public/Granted day:2013-02-07
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