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US09046680B2 Scanning illumination microscope 有权
扫描照明显微镜

Scanning illumination microscope
Abstract:
A microscopy method and configuration provides the ability to achieve wide field view and high resolution simultaneously. A beam array generator generates an M×N light beam array that illuminates a sample and an M×N sensor array. The sensor array obtains a whole microscopy image of the sample based on the light beam array. Each light beam of the array corresponds to one unique pixel sensor in the sensor array. A scanning of all light beams of the light beam array covers a whole area of the sample.
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