Invention Grant
- Patent Title: Scanning illumination microscope
- Patent Title (中): 扫描照明显微镜
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Application No.: US12399823Application Date: 2009-03-06
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Publication No.: US09046680B2Publication Date: 2015-06-02
- Inventor: Xiquan Cui , Changhuei Yang
- Applicant: Xiquan Cui , Changhuei Yang
- Applicant Address: US CA Pasadena
- Assignee: California Institute of Technology
- Current Assignee: California Institute of Technology
- Current Assignee Address: US CA Pasadena
- Agency: Gates & Cooper LLP
- Main IPC: G02B21/06
- IPC: G02B21/06 ; G02B21/00

Abstract:
A microscopy method and configuration provides the ability to achieve wide field view and high resolution simultaneously. A beam array generator generates an M×N light beam array that illuminates a sample and an M×N sensor array. The sensor array obtains a whole microscopy image of the sample based on the light beam array. Each light beam of the array corresponds to one unique pixel sensor in the sensor array. A scanning of all light beams of the light beam array covers a whole area of the sample.
Public/Granted literature
- US20090225411A1 SCANNING ILLUMINATION MICROSCOPE Public/Granted day:2009-09-10
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