Invention Grant
- Patent Title: Exposure apparatus and methods
- Patent Title (中): 曝光装置和方法
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Application No.: US13056023Application Date: 2009-07-30
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Publication No.: US09046874B2Publication Date: 2015-06-02
- Inventor: Peter Anthony Ivey , Richard Peter McWilliam , Alan Purvis , Gavin Lewis Williams , Nicholas Luke Seed , Richard Ian Curry , Jose Juan De Jesus Toriz-Garcia
- Applicant: Peter Anthony Ivey , Richard Peter McWilliam , Alan Purvis , Gavin Lewis Williams , Nicholas Luke Seed , Richard Ian Curry , Jose Juan De Jesus Toriz-Garcia
- Applicant Address: GB Durham GB Sheffield
- Assignee: University of Durham,University of Sheffield
- Current Assignee: University of Durham,University of Sheffield
- Current Assignee Address: GB Durham GB Sheffield
- Agency: Winstead PC
- Priority: GB0813907.3 20080730
- International Application: PCT/GB2009/050945 WO 20090730
- International Announcement: WO2010/013052 WO 20100204
- Main IPC: G03B27/32
- IPC: G03B27/32 ; G03B27/52 ; G03B27/54 ; G03B27/72 ; G03F1/00 ; G03H1/08 ; G03F7/20 ; G03H1/00 ; G03H1/04 ; G03H1/22 ; G03H1/26

Abstract:
A light beam collimated by illumination optics (4) from a radiation source (6) illuminates the surface of a wave front modulator (8) such as an Spatial Light Modulator (SLM) or Computer Generated Hologram photomask (CGH). The resulting wave travels via projection optics (10) to the substrate (12), passing through a projection lens assembly (14). The SLM (8) is programmed or CGH configured with a modulation pattern that is determined by the substrate (12) topography and desired pattern. The substrate topography is provided by Digital Holography (DH) surface profilometery performed by a DH microscope (18), which provides geometrical or topographical input to the CGH calculation routines (16). An arrangement for vertical or sloping surface patterning has a grating (22) superimposed onto the CGH pattern (24) to generate +1 and −1 orders. The SLM or CGH may be configured: using Fresnel patterns to provide an extended depth of field of the projected wave front; by encoding line segments of the desired pattern as cylindrical lines; by calculating inverse propagation between non-planar topography of the substrate and the SLM or CGH (using a Rayleigh-Sommerfield diffraction formula); and/or using iteration to determine a restricted encoding in the configuration of the SLM or CGH.
Public/Granted literature
- US20110292363A1 EXPOSURE APPARATUS AND METHODS Public/Granted day:2011-12-01
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