Invention Grant
US09047402B2 Automatic calculation of orthogonal defect classification (ODC) fields
有权
自动计算正交缺陷分类（ODC）领域
- Patent Title: Automatic calculation of orthogonal defect classification (ODC) fields
- Patent Title (中): 自动计算正交缺陷分类（ODC）领域
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Application No.: US13491148Application Date: 2012-06-07
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Publication No.: US09047402B2Publication Date: 2015-06-02
- Inventor: Silvia Bellucci , Bruno Portaluri
- Applicant: Silvia Bellucci , Bruno Portaluri
- Applicant Address: US NY Armonk
- Assignee: International Business Machines Corporation
- Current Assignee: International Business Machines Corporation
- Current Assignee Address: US NY Armonk
- Agent Francis Lammes; Stephen J. Walder, Jr.; Jeffrey S. LaBaw
- Main IPC: G06F9/44
- IPC: G06F9/44 ; G06F11/36
Abstract:
A method and system for Orthogonal Defect Classification (ODC) analysis in a computing system, is provided. One implementation involves determining a defect in a software application, providing a defect fix to the software application, linking the source code fix to the defect, and automatically performing ODC analysis and calculating ODC information has based on calculations against the source code linked to the defect fixed.
Public/Granted literature
- US20120246620A1 Automatic Calculation of Orthogonal Defect Classification (ODC) Fields Public/Granted day:2012-09-27
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