Invention Grant
- Patent Title: System, method and computer program product for evaluating an actual structural element of an electrical circuit
- Patent Title (中): 用于评估电路的实际结构元件的系统,方法和计算机程序产品
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Application No.: US12019619Application Date: 2008-01-24
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Publication No.: US09047532B2Publication Date: 2015-06-02
- Inventor: Ovadya Menadeva , Sergey Latinski
- Applicant: Ovadya Menadeva , Sergey Latinski
- Applicant Address: IL Rehovot
- Assignee: APPLIED MATERIALS ISRAEL, LTD.
- Current Assignee: APPLIED MATERIALS ISRAEL, LTD.
- Current Assignee Address: IL Rehovot
- Agency: Kilpatrick Townsend & Stockton LLP
- Main IPC: G06K9/00
- IPC: G06K9/00 ; G06K9/32 ; G06T7/00

Abstract:
A method, a system and a computer program product for evaluating an actual structural element of an electrical circuit. The method includes: detecting an actual structural element contour by processing a scanning electron microscope image of the actual structural element; aligning the actual structural element contour with a simulated contour to provide an aligned actual structural element contour; wherein the simulated contour is obtained by simulating a lithographic process that is responsive to a design contour; and comparing between the aligned actual structural element contour and reference information.
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