Invention Grant
US09047964B2 Multi-level memory cell using multiple magnetic tunnel junctions with varying MGO thickness
有权
使用具有不同MGO厚度的多个磁隧道结的多层存储单元
- Patent Title: Multi-level memory cell using multiple magnetic tunnel junctions with varying MGO thickness
- Patent Title (中): 使用具有不同MGO厚度的多个磁隧道结的多层存储单元
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Application No.: US13589315Application Date: 2012-08-20
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Publication No.: US09047964B2Publication Date: 2015-06-02
- Inventor: Kangho Lee , Taehyun Kim , Jung Pill Kim , Seung H. Kang
- Applicant: Kangho Lee , Taehyun Kim , Jung Pill Kim , Seung H. Kang
- Applicant Address: US CA San Diego
- Assignee: QUALCOMM Incorporated
- Current Assignee: QUALCOMM Incorporated
- Current Assignee Address: US CA San Diego
- Agent Sam Talpalatsky; Nicholas J. Pauley; Joseph Agusta
- Main IPC: G11C11/00
- IPC: G11C11/00 ; G11C11/16 ; G11C11/56 ; H01L21/00

Abstract:
A Multi-Level Memory Cell (MLC) using multiple Magnetic Tunnel Junction (MTJ) structures having one or more layers with varying thickness is disclosed. The multiple MTJ structures, which are vertically stacked and arranged in series, may have substantially identical area dimensions to minimize fabrication costs because one mask can be used to pattern the multiple MTJ structures. Further, varying the thicknesses associated with the one or more layers may provide the multiple MTJ structures with different switching current densities and thereby increase memory density and improve read and write operations. In one embodiment, the layers with the varying thicknesses may include tunnel barriers or magnesium oxide layers associated with the multiple MTJ structures and/or free layers associated with the multiple MTJ structures.
Public/Granted literature
- US20140050019A1 MULTI-LEVEL MEMORY CELL USING MULTIPLE MAGNETIC TUNNEL JUNCTIONS WITH VARYING MGO THICKNESS Public/Granted day:2014-02-20
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