Invention Grant
- Patent Title: Asymmetric log-likelihood ratio for flash channel
- Patent Title (中): 闪光通道的非对称对数似然比
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Application No.: US14500904Application Date: 2014-09-29
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Publication No.: US09047984B2Publication Date: 2015-06-02
- Inventor: Xinde Hu
- Applicant: HGST NETHERLANDS B.V.
- Applicant Address: NL Amsterdam
- Assignee: HGST Netherlands B.V.
- Current Assignee: HGST Netherlands B.V.
- Current Assignee Address: NL Amsterdam
- Agency: McDermott Will & Emery LLP
- Main IPC: G11C16/04
- IPC: G11C16/04 ; G11C11/56

Abstract:
Disclosed is a system and method for reading a flash memory cell with an adjusted read level. A current read level is set to a new read level associated with increasing a first error rate to decrease a second error rate. The first error rate is associated with determining that the most significant bit of the flash memory cell is a binary 1 and the second error rate is associated with determining that the most significant bit is a binary 0. On reading the memory cell, a probability value is generated for the most significant bit, the probability being higher if the bit is equivalent to a binary 0 than if the bit is equivalent to a binary 1.
Public/Granted literature
- US20150016187A1 ASYMMETRIC LOG-LIKELIHOOD RATIO FOR FLASH CHANNEL Public/Granted day:2015-01-15
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