Invention Grant
US09048065B2 Methods of using temperature control devices in electron microscopy
有权
电子显微镜中使用温度控制装置的方法
- Patent Title: Methods of using temperature control devices in electron microscopy
- Patent Title (中): 电子显微镜中使用温度控制装置的方法
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Application No.: US13498052Application Date: 2010-09-23
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Publication No.: US09048065B2Publication Date: 2015-06-02
- Inventor: John Damiano , Stephen Mick , David Nackashi
- Applicant: John Damiano , Stephen Mick , David Nackashi
- Applicant Address: US NC Raleigh
- Assignee: PROTOCHIPS, INC.
- Current Assignee: PROTOCHIPS, INC.
- Current Assignee Address: US NC Raleigh
- Agency: Moore & Van Allen, PLLC
- Agent Tristan A. Fuierer
- International Application: PCT/US2010/049913 WO 20100923
- International Announcement: WO2011/038062 WO 20110331
- Main IPC: H01J37/26
- IPC: H01J37/26 ; G01K7/02 ; H01J37/20 ; G01K17/00
Abstract:
Methods of using temperature control devices in electron microscopes. The temperature of the device structure may be controlled to extract information about reactions and processes that was previously unobtainable.
Public/Granted literature
- US20120292505A1 METHODS OF USING TEMPERATURE CONTROL DEVICES IN ELECTRON MICROSCOPY Public/Granted day:2012-11-22
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