Invention Grant
- Patent Title: Time-of-flight mass spectrometer
- Patent Title (中): 飞行时间质谱仪
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Application No.: US14349243Application Date: 2012-07-25
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Publication No.: US09048082B2Publication Date: 2015-06-02
- Inventor: Osamu Furuhashi
- Applicant: Osamu Furuhashi
- Applicant Address: JP Kyoto
- Assignee: SHIMADZU CORPORATION
- Current Assignee: SHIMADZU CORPORATION
- Current Assignee Address: JP Kyoto
- Agency: Sughrue Mion, PLLC
- Priority: JP2011-218913 20111003
- International Application: PCT/JP2012/068772 WO 20120725
- International Announcement: WO2013/051321 WO 20130411
- Main IPC: H01J49/40
- IPC: H01J49/40

Abstract:
A thin metal plate and two prismatic-bar-shaped metal members that are parallel to each other are alternately and repeatedly stacked, and the stack is sandwiched between two thick metal plates. Each contact surface is bonded to the counterpart surface by diffusion bonding to form an integrated multilayer body. The multilayer body is cut at predetermined intervals at planes perpendicular to the thin metal plates, whereby a grid-like electrode is completed, with the thin metal plates serving as crosspieces and the metal members serving as spacers for defining a gap which serves as openings.
Public/Granted literature
- US20140224982A1 TIME-OF-FLIGHT MASS SPECTROMETER Public/Granted day:2014-08-14
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