Invention Grant
- Patent Title: Methods for wet clean of oxide layers over epitaxial layers
- Patent Title (中): 在外延层上湿式清洁氧化层的方法
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Application No.: US13924193Application Date: 2013-06-21
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Publication No.: US09048087B2Publication Date: 2015-06-02
- Inventor: Li-Lan Wu , Chi-Yuan Chen , Ming-Chyi Liu , Cary Chia-Chiung Lo , Teng-Chun Tsai , Cheng-Tung Lin , Kuo-Yin Lin , Li-Ting Wang , Wan-Chun Pan , Ming-Liang Yen , Huicheng Chang
- Applicant: Taiwan Semiconductor Manufacturing Company, Ltd.
- Applicant Address: TW Hsin-Chu
- Assignee: Taiwan Semiconductor Manufacturing Company, Ltd.
- Current Assignee: Taiwan Semiconductor Manufacturing Company, Ltd.
- Current Assignee Address: TW Hsin-Chu
- Agency: Slater & Matsil, L.L.P
- Main IPC: H01L21/336
- IPC: H01L21/336 ; H01L21/02 ; H01L29/66 ; H01L29/775 ; B82Y10/00 ; H01L21/3105

Abstract:
Methods for an oxide layer over an epitaxial layer. In an embodiment, a method includes forming an epitaxial layer of semiconductor material over a semiconductor substrate; forming an oxide layer over the epitaxial layer; applying a solution including an oxidizer to the oxide layer; and cleaning the oxide layer with a cleaning solution. In another embodiment, a densification process is applied to an oxide layer including treating with thermal energy, UV energy, or both. In an embodiment for a gate-all-around device, the cleaning process is applied to an oxide layer over an epitaxial portion of a fin. Additional methods are disclosed.
Public/Granted literature
- US20140273412A1 Methods for Wet Clean of Oxide Layers over Epitaxial Layers Public/Granted day:2014-09-18
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