Invention Grant
- Patent Title: ESD protection circuit
- Patent Title (中): ESD保护电路
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Application No.: US13149176Application Date: 2011-05-31
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Publication No.: US09048101B2Publication Date: 2015-06-02
- Inventor: Yung-Chih Liang , Chih-Ting Yeh
- Applicant: Yung-Chih Liang , Chih-Ting Yeh
- Applicant Address: TW Chutung
- Assignee: Industrial Technology Research Institute
- Current Assignee: Industrial Technology Research Institute
- Current Assignee Address: TW Chutung
- Agency: Wang Law Firm, Inc.
- Agent Li K. Wang; Stephen Hsu
- Priority: TW99146287A 20101228
- Main IPC: H01L27/02
- IPC: H01L27/02 ; H01L23/60 ; H01L23/62 ; H02H9/04 ; H02H3/20

Abstract:
One embodiment of the disclosure provides an electrostatic discharge protection circuit, including a first resistor, a p-type field effect transistor, a capacitance device and an n-type field effect transistor. The first resistor has a first terminal coupled to a first rail and a second terminal coupled to a first node. The p-type field effect transistor has a source coupled to the first rail, a gate coupled to the first node and a drain coupled to a second node. The capacitance device has a first terminal coupled to a second rail or the second node and a second terminal coupled to the first node. The n-type field effect transistor has a source coupled to the second rail, a gate coupled to the second node and a drain coupled to the first node.
Public/Granted literature
- US20120161216A1 ESD Protection Circuit Public/Granted day:2012-06-28
Information query
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