Invention Grant
US09048262B2 Multi-fin finFETs with merged-fin source/drains and replacement gates 有权
具有并联源/漏极和替换门的多鳍鳍FET

Multi-fin finFETs with merged-fin source/drains and replacement gates
Abstract:
A semiconductor structure including semiconductor fins, a gate over a middle portion of the semiconductor fins, and faceted semiconductor regions outside of the gate separated from gaps may be formed. The semiconductor structure may be formed by forming fins on a semiconductor substrate where each fin has a pair of sidewalls aligned parallel to the length of the fin, growing dummy semiconductor regions on the sidewalls of the fins, forming a sacrificial gate that covers a center portion of the fins and the dummy semiconductor regions, removing portions of the dummy semiconductor regions not covered by the sacrificial gate, and growing faceted semiconductor regions on the sidewalls of the portions of the fins not covered by the sacrificial gate. The faceted semiconductor regions may intersect to form gaps between the faceted semiconductor regions and the gate.
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