Invention Grant
- Patent Title: Hybrid bonding systems and methods for semiconductor wafers
- Patent Title (中): 用于半导体晶片的混合键合系统和方法
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Application No.: US13542507Application Date: 2012-07-05
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Publication No.: US09048283B2Publication Date: 2015-06-02
- Inventor: Ping-Yin Liu , Shih-Wei Lin , Xin-Hua Huang , Lan-Lin Chao , Chia-Shiung Tsai
- Applicant: Ping-Yin Liu , Shih-Wei Lin , Xin-Hua Huang , Lan-Lin Chao , Chia-Shiung Tsai
- Applicant Address: TW Hsin-Chu
- Assignee: Taiwan Semiconductor Manufacturing Company, Ltd.
- Current Assignee: Taiwan Semiconductor Manufacturing Company, Ltd.
- Current Assignee Address: TW Hsin-Chu
- Agency: Slater & Matsil, L.L.P.
- Main IPC: H01L21/30
- IPC: H01L21/30 ; H01L23/00

Abstract:
Hybrid bonding systems and methods for semiconductor wafers are disclosed. In one embodiment, a hybrid bonding system for semiconductor wafers includes a chamber and a plurality of sub-chambers disposed within the chamber. A robotics handler is disposed within the chamber that is adapted to move a plurality of semiconductor wafers within the chamber between the plurality of sub-chambers. The plurality of sub-chambers includes a first sub-chamber adapted to remove a protection layer from the plurality of semiconductor wafers, and a second sub-chamber adapted to activate top surfaces of the plurality of semiconductor wafers prior to hybrid bonding the plurality of semiconductor wafers together. The plurality of sub-chambers also includes a third sub-chamber adapted to align the plurality of semiconductor wafers and hybrid bond the plurality of semiconductor wafers together.
Public/Granted literature
- US20140011324A1 Hybrid Bonding Systems and Methods for Semiconductor Wafers Public/Granted day:2014-01-09
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