Invention Grant
- Patent Title: Method and apparatus for detecting RF field strength
- Patent Title (中): 检测射频场强的方法和装置
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Application No.: US13209425Application Date: 2011-08-14
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Publication No.: US09048819B2Publication Date: 2015-06-02
- Inventor: Shahriar Rokhsaz , Edwin de Angel
- Applicant: Shahriar Rokhsaz , Edwin de Angel
- Applicant Address: US TX Austin
- Assignee: RF Micron, Inc.
- Current Assignee: RF Micron, Inc.
- Current Assignee Address: US TX Austin
- Agency: The Law Offices of Robert A. McLauchlan
- Agent Robert A. McLauchlan
- Main IPC: H04Q5/22
- IPC: H04Q5/22 ; G08B13/14 ; H03J3/20

Abstract:
A method and apparatus for detecting RF field strength. A field strength reference generator develops a field strength reference current as a function of a field strength of a received RF signal; and a field strength quantizer develops a digital field-strength value indicative of the field strength reference current. In one embodiment, detected field strength is used to dynamically vary the impedance of a tank circuit whereby, over time, induced current is maximized. In another embodiment, using the quantized field strength to sense changes to the environment to which the RFID tag is exposed.
Public/Granted literature
- US20110291810A1 Method and Apparatus for Detecting RF Field Strength Public/Granted day:2011-12-01
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