Invention Grant
US09049422B2 Data throttling to facilitate full frame readout of an optical sensor for wafer testing 有权
数据调节以便于全面读出用于晶片测试的光学传感器

Data throttling to facilitate full frame readout of an optical sensor for wafer testing
Abstract:
Providing for operation of high-speed optical sensor equipment at full data path speeds in conjunction with testing equipment operating at a lower speed is described herein. By way of example, a data stream output from optical sensor equipment to testing equipment can be throttled at a serial interface between such equipment. Throttling can involve subdividing a set of pixel data and outputting a subset of the pixel data in a given readout frame. Consecutive outputs of respective subsets of pixel data are initiated with an offset from the previous readout frame. Accordingly, the optical sensor equipment can be operated at full speeds, simulating realistic operational conditions, while slower testing equipment can be utilized to perform data analytics, heuristics, and other quality tests on various portions of the optical sensor equipment.
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