Invention Grant
- Patent Title: Location measurement apparatus and method
- Patent Title (中): 位置测量装置和方法
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Application No.: US13731464Application Date: 2012-12-31
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Publication No.: US09049679B2Publication Date: 2015-06-02
- Inventor: Jae-Bok Park , Duk-Kyun Woo
- Applicant: Electronics and Telecommunications Research Institute
- Applicant Address: KR Daejeon
- Assignee: ELECTRONICS AND TELECOMMUNICATIONS RESEARCH INSTITUTE
- Current Assignee: ELECTRONICS AND TELECOMMUNICATIONS RESEARCH INSTITUTE
- Current Assignee Address: KR Daejeon
- Agency: Rabin & Berdo, P.C.
- Priority: KR10-2012-0070117 20120628
- Main IPC: H04W64/00
- IPC: H04W64/00 ; H04Q5/22 ; H04L12/26

Abstract:
Disclosed herein are a location measurement method and apparatus. The apparatus includes a first grading unit, a first presumed line calculation unit, a second grading unit, a second presumed lined calculating unit, a presumed location calculation unit, and a final location calculation unit. The first grading unit determines the grade of a first RSSI. The first presumed line calculation unit calculates the range of the object from a first node based on the grade of the first RSSI. The second grading unit determines the grade of a second RSSI. The second presumed line calculating unit calculates the range of the object from a second node based on the grade of the second RSSI. The presumed location calculation unit calculates two presumed locations. The final location calculation unit determines one of the two presumed locations to be the final location of the object.
Public/Granted literature
- US20140004878A1 LOCATION MEASUREMENT APPARATUS AND METHOD Public/Granted day:2014-01-02
Information query