Invention Grant
US09049679B2 Location measurement apparatus and method 有权
位置测量装置和方法

Location measurement apparatus and method
Abstract:
Disclosed herein are a location measurement method and apparatus. The apparatus includes a first grading unit, a first presumed line calculation unit, a second grading unit, a second presumed lined calculating unit, a presumed location calculation unit, and a final location calculation unit. The first grading unit determines the grade of a first RSSI. The first presumed line calculation unit calculates the range of the object from a first node based on the grade of the first RSSI. The second grading unit determines the grade of a second RSSI. The second presumed line calculating unit calculates the range of the object from a second node based on the grade of the second RSSI. The presumed location calculation unit calculates two presumed locations. The final location calculation unit determines one of the two presumed locations to be the final location of the object.
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