Invention Grant
- Patent Title: Impedance analyzer
- Patent Title (中): 阻抗分析仪
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Application No.: US13555616Application Date: 2012-07-23
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Publication No.: US09050017B2Publication Date: 2015-06-09
- Inventor: Tak-Shing Ching , Tai-Ping Sun , Chia-Ming Liu
- Applicant: Tak-Shing Ching , Tai-Ping Sun , Chia-Ming Liu
- Applicant Address: TW Nantou
- Assignee: National Chi Nan University
- Current Assignee: National Chi Nan University
- Current Assignee Address: TW Nantou
- Agency: LeClairRyan
- Priority: TW101100312A 20120104
- Main IPC: A61B5/053
- IPC: A61B5/053 ; G01R31/28 ; G01R27/26

Abstract:
An impedance analyzer includes: a control voltage generating unit for generating a control voltage that has a predetermined amplitude value; a measuring unit operable to provide an output current, which has an amplitude value corresponding to that of the control voltage, for flowing through first and second body portions of a biological target, and to generate a measurement voltage that has an amplitude value corresponding to a difference between voltages at the first and second body portions attributed to flow of the output current therethrough; and a calculating module operable to determine an electrical impedance between the first and second body portions according to a predetermined adjustment value and the amplitude value of the measurement voltage.
Public/Granted literature
- US20130169296A1 IMPEDANCE ANALYZER Public/Granted day:2013-07-04
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