Invention Grant
- Patent Title: Cobalt deposition on barrier surfaces
- Patent Title (中): 阻挡表面上的钴沉积
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Application No.: US12201976Application Date: 2008-08-29
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Publication No.: US09051641B2Publication Date: 2015-06-09
- Inventor: Jiang Lu , Hyoung-Chan Ha , Paul Ma , Seshadri Ganguli , Joseph F. Aubuchon , Sang Ho Yu , Murali K. Narasimhan
- Applicant: Jiang Lu , Hyoung-Chan Ha , Paul Ma , Seshadri Ganguli , Joseph F. Aubuchon , Sang Ho Yu , Murali K. Narasimhan
- Applicant Address: US CA Santa Clara
- Assignee: APPLIED MATERIALS, INC.
- Current Assignee: APPLIED MATERIALS, INC.
- Current Assignee Address: US CA Santa Clara
- Agency: Patterson & Sheridan, LLP
- Main IPC: B05D5/12
- IPC: B05D5/12 ; C23C16/16 ; C23C16/18 ; C23C16/42 ; C23C16/56 ; H01L21/285 ; H01L21/768

Abstract:
Embodiments of the invention provide processes for depositing a cobalt layer on a barrier layer and subsequently depositing a conductive material, such as copper or a copper alloy, thereon. In one embodiment, a method for depositing materials on a substrate surface is provided which includes forming a barrier layer on a substrate, exposing the substrate to dicobalt hexacarbonyl butylacetylene (CCTBA) and hydrogen to form a cobalt layer on the barrier layer during a vapor deposition process (e.g., CVD or ALD), and depositing a conductive material over the cobalt layer. In some examples, the barrier layer and/or the cobalt layer may be exposed to a gas or a reagent during a treatment process, such as a thermal process, an in situ plasma process, or a remote plasma process.
Public/Granted literature
- US20090053426A1 COBALT DEPOSITION ON BARRIER SURFACES Public/Granted day:2009-02-26
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