Invention Grant
- Patent Title: Device for analising a radiating material using a microprobe
- Patent Title (中): 使用微探针分析辐射材料的装置
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Application No.: US14356332Application Date: 2012-11-15
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Publication No.: US09052272B2Publication Date: 2015-06-09
- Inventor: Jérôme Lamontagne , Thierry Blay , Philippe Benard
- Applicant: COMMISSARIAT A L'ENERGIE ATOMIQUE ET AUX ENERGIES ALTERNATIVES
- Applicant Address: FR Paris
- Assignee: Commisariat a L'Energie Atomique et aux Energies Alternatives
- Current Assignee: Commisariat a L'Energie Atomique et aux Energies Alternatives
- Current Assignee Address: FR Paris
- Agency: Ladas & Parry LLP
- Priority: FR1103461 20111115
- International Application: PCT/FR2012/000462 WO 20121115
- International Announcement: WO2013/072580 WO 20130523
- Main IPC: G01Q10/04
- IPC: G01Q10/04 ; G01N23/22 ; H01J37/18 ; H01J37/252 ; G01N23/225
Abstract:
The invention relates to an analysis device comprising a main enclosure fitted with a secondary enclosure, a microprobe placed inside the main enclosure and fitted with an airlock and with a motion object, and a movable sample support that is movable from the secondary enclosure to the airlock and from the airlock to the motion object. Each of the airlock and the motion object includes a respective guide member for guiding the movable sample support and a respective sensor for detecting the presence of the movable sample support.
Public/Granted literature
- US20140326880A1 DEVICE FOR ANALISING A RADIATING MATERIAL USING A MICROPROBE Public/Granted day:2014-11-06
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