Invention Grant
- Patent Title: Method and system for two-dimensional and three-dimensional inspection of a workpiece
- Patent Title (中): 对工件二维和三维检查的方法和系统
-
Application No.: US11421273Application Date: 2006-05-31
-
Publication No.: US09052294B2Publication Date: 2015-06-09
- Inventor: Steven R. Walton
- Applicant: Steven R. Walton
- Applicant Address: US IL Chicago
- Assignee: The Boeing Company
- Current Assignee: The Boeing Company
- Current Assignee Address: US IL Chicago
- Agency: Alston & Bird LLP
- Main IPC: G06K9/00
- IPC: G06K9/00 ; G01N21/88 ; G06T7/00 ; G01N21/84

Abstract:
A system and method for inspecting a workpiece are provided. According to one embodiment, the system includes a plurality of illumination sources positioned proximate to the workpiece and each operable to generate at least one respective illumination beam to illuminate at least a portion of the workpiece, wherein each beam has a different respective color. The system also includes at least one camera positioned proximate to the workpiece and operable to capture at least one image of at least a portion of the workpiece including the illumination beams incident thereon. In addition, the system includes a data system capable of providing simultaneous two-dimensional and three-dimensional information indicative of the workpiece based on the image acquired by the camera.
Public/Granted literature
- US20070280501A1 Method and System for Two-Dimensional and Three-Dimensional Inspection of a Workpiece Public/Granted day:2007-12-06
Information query