Invention Grant
US09052362B2 Scan test port capture/shift signals maintaining/transitioning sequence and idle states
有权
扫描测试端口捕获/移位信号维持/转换序列和空闲状态
- Patent Title: Scan test port capture/shift signals maintaining/transitioning sequence and idle states
- Patent Title (中): 扫描测试端口捕获/移位信号维持/转换序列和空闲状态
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Application No.: US14190330Application Date: 2014-02-26
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Publication No.: US09052362B2Publication Date: 2015-06-09
- Inventor: Lee D. Whetsel
- Applicant: Texas Instruments Incorporated
- Applicant Address: US TX Dallas
- Assignee: TEXAS INSTRUMENTS INCORPORATED
- Current Assignee: TEXAS INSTRUMENTS INCORPORATED
- Current Assignee Address: US TX Dallas
- Agent Lawrence J. Bassuk; Frank D. Cimino
- Main IPC: G01R31/3177
- IPC: G01R31/3177 ; G01R31/3185

Abstract:
Operating a state machine includes enabling operation of the state machine upon receiving a signal indicating a change from operation of a test access port to a scan test port. The process maintains the state machine in an IDLE 1 state while receiving a scan test port capture signal and transitions the state machine to an IDLE 2 state when receiving a scan test port shift signal. The process then transitions the state machine to a SEQUENCE 1 state, then to a SEQUENCE 2 state, and then to a SEQUENCE 3 state when receiving sequential scan test port capture signals. The state machine then transitions to an UNLOCK TAP state and then back to the IDLE 1 state when receiving sequential scan test port shift signals on the test mode select/capture select lead.
Public/Granted literature
- US20140181607A1 LOCK STATE MACHINE OPERATIONS UPON STP DATA CAPTURES AND SHIFTS Public/Granted day:2014-06-26
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