Invention Grant
- Patent Title: Determining correspondence mappings from infrared patterns projected during the projection of visual content
- Patent Title (中): 确定在投影视觉内容期间投射的红外图案的对应关系
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Application No.: US11776796Application Date: 2007-07-12
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Publication No.: US09052575B2Publication Date: 2015-06-09
- Inventor: Nelson Liang An Chang , Niranjan Damera-Venkata , Simon Widdowson
- Applicant: Nelson Liang An Chang , Niranjan Damera-Venkata , Simon Widdowson
- Applicant Address: US TX Houston
- Assignee: Hewlett-Packard Development Company, L.P.
- Current Assignee: Hewlett-Packard Development Company, L.P.
- Current Assignee Address: US TX Houston
- Agency: Dicke, Billig & Czaja, PLLC
- Main IPC: G03B21/14
- IPC: G03B21/14 ; G03B21/00 ; G06K9/20 ; G06T3/00 ; G06T11/00 ; G06K9/32
Abstract:
A method performed by a display system is provided. The method includes projecting a first infrared pattern from a first projection plane of a first projector into a scene, capturing the first infrared pattern from the scene in a capture plane of at least one image capture device, and determining a first correspondence mapping between the first projector and the image capture device from at least the first infrared pattern in the first projection plane and the first infrared pattern in the capture plane.
Public/Granted literature
- US20090015791A1 SYSTEM AND METHOD FOR GENERATING CORRESPONDENCE MAPPINGS USING INFRARED PATTERNS Public/Granted day:2009-01-15
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