Invention Grant
US09052981B2 System and method to map defect reduction data to organizational maturity profiles for defect projection modeling
有权
将缺陷减少数据映射到缺陷投影建模的组织成熟度概况的系统和方法
- Patent Title: System and method to map defect reduction data to organizational maturity profiles for defect projection modeling
- Patent Title (中): 将缺陷减少数据映射到缺陷投影建模的组织成熟度概况的系统和方法
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Application No.: US14041440Application Date: 2013-09-30
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Publication No.: US09052981B2Publication Date: 2015-06-09
- Inventor: Kathryn A. Bassin , Steven Kagan , Susan E. Skrabanek
- Applicant: INTERNATIONAL BUSINESS MACHINES CORPORATION
- Applicant Address: US NY Armonk
- Assignee: INTERNATIONAL BUSINESS MACHINES CORPORATION
- Current Assignee: INTERNATIONAL BUSINESS MACHINES CORPORATION
- Current Assignee Address: US NY Armonk
- Agency: Roberts Mlotkowski Safran & Cole, P.C.
- Agent Matthew Chung
- Main IPC: G06F9/44
- IPC: G06F9/44 ; G06Q10/06

Abstract:
A method is implemented in a computer infrastructure having computer executable code tangibly embodied on a computer readable storage medium having programming instructions. The programming instructions are operable to receive a maturity level for an organization and select at least one defect analysis starter/defect reduction method (DAS/DRM) defect profile based on the maturity level. Additionally, the programming instructions are operable to determine a projection analysis for one or more stages of the life cycle of a software code project of the organization based on the at least one DAS/DRM defect profile.
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