Invention Grant
- Patent Title: Non-volatile memory devices and methods of manufacturing the same
- Patent Title (中): 非易失性存储器件及其制造方法
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Application No.: US13732512Application Date: 2013-01-02
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Publication No.: US09053763B2Publication Date: 2015-06-09
- Inventor: Hyun Heo
- Applicant: SK hynix Inc.
- Applicant Address: KR Gyeonggi-do
- Assignee: SK Hynix Inc.
- Current Assignee: SK Hynix Inc.
- Current Assignee Address: KR Gyeonggi-do
- Agency: William Park & Associates Ltd.
- Priority: KR10-2012-0097782 20120904
- Main IPC: G11C7/00
- IPC: G11C7/00 ; G11C7/10 ; H01L21/28 ; G11C16/12 ; G11C13/00

Abstract:
This technology relates to nonvolatile memory devices and methods of manufacturing the same. A nonvolatile memory device can include a memory cell array configured to include a plurality of strings, a page buffer unit connected to the plurality of strings, respectively, and configured to sense data, and a switching unit disposed between the memory cell array and the page buffer unit and configured to comprise a variable resistor.
Public/Granted literature
- US20140063978A1 NON-VOLATILE MEMORY DEVICES AND METHODS OF MANUFACTURING THE SAME Public/Granted day:2014-03-06
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