Invention Grant
US09053810B2 Defect or program disturb detection with full data recovery capability
有权
缺陷或编程干扰检测具有全面的数据恢复能力
- Patent Title: Defect or program disturb detection with full data recovery capability
- Patent Title (中): 缺陷或编程干扰检测具有全面的数据恢复能力
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Application No.: US13790469Application Date: 2013-03-08
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Publication No.: US09053810B2Publication Date: 2015-06-09
- Inventor: Deepanshu Dutta , Dana Lee , Yan Li , Grishma Shah , Farookh Moogat , Masaaki Higashitani
- Applicant: SanDisk Technologies Inc.
- Applicant Address: US TX Plano
- Assignee: SanDisk Technologies Inc.
- Current Assignee: SanDisk Technologies Inc.
- Current Assignee Address: US TX Plano
- Agency: Vierra Magen Marcus LLP
- Main IPC: G11C16/04
- IPC: G11C16/04 ; G11C16/34 ; G11C16/10 ; G11C11/56

Abstract:
A programming operation for a set of non-volatile storage elements determines whether the storage elements have been programmed properly after a program-verify test is passed and a program status=pass is issued. Write data is reconstructed from sets of latches associated with the storage elements using logical operations optionally one or more reconstruction read operations. Normal read operations are also performed to obtain read data. A number of mismatches between the read data and the reconstructed write data is determined, and determination is made as to whether re-writing of the write data is required based on the number of the mismatches.
Public/Granted literature
- US20140254264A1 Defect Or Program Disturb Detection With Full Data Recovery Capability Public/Granted day:2014-09-11
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