Invention Grant
- Patent Title: Method for manufacturing a semiconductor device
- Patent Title (中): 半导体器件的制造方法
-
Application No.: US13682995Application Date: 2012-11-21
-
Publication No.: US09054123B2Publication Date: 2015-06-09
- Inventor: Kurt Sorschag
- Applicant: Infineon Technologies Austria AG
- Applicant Address: AT Villach
- Assignee: Infineon Technologies Austria AG
- Current Assignee: Infineon Technologies Austria AG
- Current Assignee Address: AT Villach
- Agency: Murphy, Bilak & Homiller, PLLC
- Main IPC: H01L21/76
- IPC: H01L21/76 ; H01L21/20 ; H01L21/311 ; H01L29/66 ; H01L29/20

Abstract:
A method for producing a semiconductor device is provided. The method includes: providing a wafer including an upper surface and a plurality of semiconductor mesas extending to the upper surface; forming a first support structure made of a first material and adjoining the plurality of semiconductor mesas at the upper surface so that adjacent pairs of the plurality of semiconductor mesas are bridged by the first support structure; forming a second support structure made of a second material different from the first material and adjoining the plurality of semiconductor mesas at the upper surface so that the adjacent pairs of the plurality of semiconductor mesas are bridged by the second support structure; removing the first support structure; and at least partly removing the second support structure.
Public/Granted literature
- US20140141594A1 Method for Manufacturing a Semiconductor Device Public/Granted day:2014-05-22
Information query
IPC分类: