Invention Grant
- Patent Title: Method of manufacturing a semiconductor device and a semiconductor workpiece
- Patent Title (中): 制造半导体器件和半导体工件的方法
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Application No.: US13716967Application Date: 2012-12-17
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Publication No.: US09070741B2Publication Date: 2015-06-30
- Inventor: Andreas Meiser , Markus Zundel , Martin Poelzl , Paul Ganitzer , Georg Ehrentraut
- Applicant: Infineon Technologies Austria AG
- Applicant Address: AT Villach
- Assignee: Infineon Technologies Austria AG
- Current Assignee: Infineon Technologies Austria AG
- Current Assignee Address: AT Villach
- Agency: Murphy, Bilak & Homiller, PLLC
- Main IPC: H01L21/78
- IPC: H01L21/78 ; H01L21/762 ; H01L21/822 ; H01L29/78

Abstract:
A semiconductor device is manufactured in a semiconductor substrate comprising a first main surface, the semiconductor substrate including chip areas. The method of manufacturing the semiconductor substrate comprises forming components of the semiconductor device in the first main surface in the chip areas, removing substrate material from a second main surface of the semiconductor substrate, the second main surface being opposite to the first main surface, forming a separation trench into a first main surface of the semiconductor substrate, the separation trench being disposed between adjacent chip areas. The method further comprises forming at least one sacrificial material in the separation trench, and removing the at least one sacrificial material from the trench.
Public/Granted literature
- US20140167209A1 Method of Manufacturing a Semiconductor Device and a Semiconductor Workpiece Public/Granted day:2014-06-19
Information query
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