Invention Grant
- Patent Title: Image sensor and fabricating method of image sensor
- Patent Title (中): 图像传感器和图像传感器的制造方法
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Application No.: US14207470Application Date: 2014-03-12
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Publication No.: US09070802B2Publication Date: 2015-06-30
- Inventor: Yang Wu , Feixia Yu , Inna Patrick , Yu Hin Desmond Cheung
- Applicant: Himax Imaging, Inc.
- Applicant Address: KY Grand Cayman
- Assignee: Himax Imaging, Inc.
- Current Assignee: Himax Imaging, Inc.
- Current Assignee Address: KY Grand Cayman
- Agent Winston Hsu; Scott Margo
- Main IPC: H01L27/146
- IPC: H01L27/146 ; H01L31/113 ; H01L31/18 ; H01L31/0352

Abstract:
The present invention provides an image sensor and a fabricating method of the image sensor. The image sensor comprises: a first type epitaxial layer, a photodiode region, a first type well region, a gate region of a source follower transistor, and a first type implant isolation region. The first type well region is formed within the first type epitaxial layer with a first horizontal distance to the photodiode region and a vertical distance to a surface of the first type epitaxial layer. The gate region of a source follower transistor is formed on the surface of the first type epitaxial layer and above the first type well region, and has a second horizontal distance to the photodiode region. There is a distance between the first type implant isolation region and the first type well region as an anti-blooming path.
Public/Granted literature
- US20150048466A1 IMAGE SENSOR AND FABRICATING METHOD OF IMAGE SENSOR Public/Granted day:2015-02-19
Information query
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