Invention Grant
- Patent Title: Extended single-bit error correction and multiple-bit error detection
- Patent Title (中): 扩展单位纠错和多位错误检测
-
Application No.: US14059063Application Date: 2013-10-21
-
Publication No.: US09071273B2Publication Date: 2015-06-30
- Inventor: David R. Resnick
- Applicant: Micron Technology, Inc.
- Applicant Address: US ID Boise
- Assignee: Micron Technology, Inc.
- Current Assignee: Micron Technology, Inc.
- Current Assignee Address: US ID Boise
- Agency: Schwegman Lundberg & Woessner, P.A.
- Main IPC: H03M13/05
- IPC: H03M13/05 ; G06F11/10 ; H03M13/19
Abstract:
Some embodiments include apparatus and methods to prevent at least one of misidentifying and ignoring multiple-bit errors if the multiple-bit errors include a plurality of erroneous data bits that belong to only one specific group of a plurality of groups of data bits and if none of the other groups of the plurality of groups have errors.
Public/Granted literature
- US20140053045A1 EXTENDED SINGLE-BIT ERROR CORRECTION AND MULTIPLE-BIT ERROR DETECTION Public/Granted day:2014-02-20
Information query
IPC分类:
