Invention Grant
- Patent Title: Probe for ultrasonic diagnostic apparatus and method of manufacturing the same
- Patent Title (中): 超声波诊断仪的探头及其制造方法
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Application No.: US12725362Application Date: 2010-03-16
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Publication No.: US09073086B2Publication Date: 2015-07-07
- Inventor: Jin Woo Jung , Jeong Cheol Seo , Jae Yk Kim
- Applicant: Jin Woo Jung , Jeong Cheol Seo , Jae Yk Kim
- Applicant Address: KR Hongcheon-Gun, Gangwon-Do
- Assignee: SAMSUNG MEDISON CO., LTD.
- Current Assignee: SAMSUNG MEDISON CO., LTD.
- Current Assignee Address: KR Hongcheon-Gun, Gangwon-Do
- Agency: McDermott Will & Emery LLP
- Priority: KR10-2009-0023013 20090318
- Main IPC: A61B5/05
- IPC: A61B5/05 ; B06B1/06 ; G10K11/00

Abstract:
A probe for an ultrasonic diagnostic apparatus includes a backing layer including backing members, a first connector bonded between the backing members and including electrodes spaced from each other in an arrangement direction, and a piezoelectric member electrically connected to the electrodes. A method of manufacturing the same is also disclosed. The piezoelectric member is connected to the first connector or to first and second connectors via an electrode layer instead of using a complicated and laborious soldering operation, thereby enabling easy connection between the piezoelectric member and the connector while preventing deterioration in performance caused by defective connection therebetween and deterioration in performance of the piezoelectric member caused by heat during manufacturing operation.
Public/Granted literature
- US20100241003A1 Probe For Ultrasonic Diagnostic Apparatus And Method Of Manufacturing The Same Public/Granted day:2010-09-23
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