Invention Grant
US09075043B2 Sample analyzer, sample information processing apparatus, and sample analysis method
有权
样品分析仪，样品信息处理设备和样品分析方法
- Patent Title: Sample analyzer, sample information processing apparatus, and sample analysis method
- Patent Title (中): 样品分析仪，样品信息处理设备和样品分析方法
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Application No.: US14035541Application Date: 2013-09-24
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Publication No.: US09075043B2Publication Date: 2015-07-07
- Inventor: Toru Mizumoto , Fumio Inoue
- Applicant: Toru Mizumoto , Fumio Inoue
- Applicant Address: JP Hyogo
- Assignee: SYSMEX CORPORATION
- Current Assignee: SYSMEX CORPORATION
- Current Assignee Address: JP Hyogo
- Agency: Sughrue Mion, PLLC
- Priority: JP2011-065537 20110324
- Main IPC: G01N33/493
- IPC: G01N33/493 ; G01N35/00 ; G01N33/50
Abstract:
A sample analyzer includes: a first measurement part which performs measurement on a sample for a first measurement item; a second measurement part which performs a measurement on the sample for a second measurement item; an output section; and a controller configured to control the output section to output, when a time difference between a measurement on a sample performed by the first measurement part and a measurement on the sample performed by the second measurement part exceeds a predetermined time period, information based on an excess of the time difference.
Public/Granted literature
- US20140024072A1 SAMPLE ANALYZER, SAMPLE INFORMATION PROCESSING APPARATUS, AND SAMPLE ANALYSIS METHOD Public/Granted day:2014-01-23
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