Invention Grant
- Patent Title: Probe card
- Patent Title (中): 探针卡
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Application No.: US13896705Application Date: 2013-05-17
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Publication No.: US09075083B2Publication Date: 2015-07-07
- Inventor: Yoshihito Onuma , Yoshihito Kitabatake , Ken Hasegawa , Takayuki Kogawa
- Applicant: KABUSHIKI KAISHA NIHON MICRONICS
- Applicant Address: JP Tokyo
- Assignee: KABUSHIKI KAISHA NIHON MICRONICS
- Current Assignee: KABUSHIKI KAISHA NIHON MICRONICS
- Current Assignee Address: JP Tokyo
- Agency: Bacon & Thomas, PLLC
- Priority: JP2012-122381 20120529
- Main IPC: G01R31/00
- IPC: G01R31/00 ; G01R1/04 ; G01R1/073

Abstract:
An electrode and wiring can be provided on an FPC board without restriction by a through hole. A probe card in which an FPC board of a probe assembly is fixed to the main board side by a clamp mechanism is provided. The clamp mechanism is provided with a fixing ring fixed to the main board side and on which the FPC board is mounted and a rotating ring screwed into the fixing ring and pressing a peripheral edge portion of the FPC board. In the fixing ring, a pressing ring pressed by screwing of the rotating ring for pressing the peripheral edge portion of the FPC board to the main board side is provided.
Public/Granted literature
- US20130328585A1 PROBE CARD Public/Granted day:2013-12-12
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