Invention Grant
US09075085B2 Test system for analyzing a circuit carrier 有权
用于分析电路载体的测试系统

Test system for analyzing a circuit carrier
Abstract:
A test system for analyzing a circuit carrier which has been populated with a radio-frequency structure comprises a network analyzer having a signal generator for generating excitation signal which can be supplied to the radio-frequency structure via a signal line, an evaluation device for analyzing a measurement signal which returns from the radio-frequency structure, and a contact device which can be connected to the signal line and is intended to feed the excitation signal into the radio-frequency structure and to output the measurement signal. The contact device preferably has a measuring tip which is intended to hold test needles and can be used to make contact with a test point which is arranged on the circuit carrier and can be connected to the radio-frequency structure for signaling purposes.
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