Invention Grant
- Patent Title: Test system for analyzing a circuit carrier
- Patent Title (中): 用于分析电路载体的测试系统
-
Application No.: US12161642Application Date: 2007-01-09
-
Publication No.: US09075085B2Publication Date: 2015-07-07
- Inventor: Josef Koeppl
- Applicant: Josef Koeppl
- Applicant Address: DE Munich
- Assignee: Rohde & Schwarz GmbH & Co. KG
- Current Assignee: Rohde & Schwarz GmbH & Co. KG
- Current Assignee Address: DE Munich
- Agency: Christensen O'Connor Johnson Kindness PLLC
- Priority: DE102006006082 20060209; DE102006021569 20060509
- International Application: PCT/EP2007/000127 WO 20070109
- International Announcement: WO2007/090490 WO 20070816
- Main IPC: G01R31/20
- IPC: G01R31/20 ; G01R27/02 ; G01R1/067 ; G01R31/28 ; G01R1/24 ; G01R27/28

Abstract:
A test system for analyzing a circuit carrier which has been populated with a radio-frequency structure comprises a network analyzer having a signal generator for generating excitation signal which can be supplied to the radio-frequency structure via a signal line, an evaluation device for analyzing a measurement signal which returns from the radio-frequency structure, and a contact device which can be connected to the signal line and is intended to feed the excitation signal into the radio-frequency structure and to output the measurement signal. The contact device preferably has a measuring tip which is intended to hold test needles and can be used to make contact with a test point which is arranged on the circuit carrier and can be connected to the radio-frequency structure for signaling purposes.
Public/Granted literature
- US20100233964A1 TEST SYSTEM FOR A CIRCUIT CARRIER Public/Granted day:2010-09-16
Information query