A process and apparatus for performing a ground fault test of a device is disclosed. A current level may be selected from a plurality of predetermined current levels. A ground fault current may be generated between a first power line and a ground at the selected current level until a ground fault interrupter within the device trips, or until expiration of an on-time period associated with the selected current level. The ground fault current may then be set to zero for an off-time period associated with the selected current level. The process may be repeated for each of the plurality of current levels. When the ground fault interrupter within the device trips, the current level and a time interval from an onset of the ground fault current at the selected level and a time when the ground fault interrupter tripped may be recorded.