Invention Grant
US09075153B2 Method for correcting count rate drift in a quantum-counting detector, an X-ray system with a quantum-counting detector and a circuit arrangement for a quantum-counting detector
有权
用于校正量子计数检测器中的计数率漂移的方法，具有量子计数检测器的X射线系统和用于量子计数检测器的电路装置
- Patent Title: Method for correcting count rate drift in a quantum-counting detector, an X-ray system with a quantum-counting detector and a circuit arrangement for a quantum-counting detector
- Patent Title (中): 用于校正量子计数检测器中的计数率漂移的方法，具有量子计数检测器的X射线系统和用于量子计数检测器的电路装置
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Application No.: US13483326Application Date: 2012-05-30
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Publication No.: US09075153B2Publication Date: 2015-07-07
- Inventor: Steffen Kappler
- Applicant: Steffen Kappler
- Applicant Address: DE Munich
- Assignee: SIEMENS AKTIENGSELLSCHAFT
- Current Assignee: SIEMENS AKTIENGSELLSCHAFT
- Current Assignee Address: DE Munich
- Agency: Harness, Dickey & Pierce, P.L.C.
- Priority: DE102011076781 20110531
- Main IPC: G01T1/40
- IPC: G01T1/40 ; A61B6/03
Abstract:
A method, a circuit arrangement and an X-ray system, in particular a CT system, are disclosed wherein, in order to correct the count rate drift of a detector for ionizing radiation having quantum-counting detector elements which include a combination of at least two counters with significantly different energy thresholds, and on the basis of previously determined functional dependencies of count rates on one another and using at least one of the counters per detector element as the reference, the count rates of the respective other counters with different energy thresholds are corrected.
Public/Granted literature
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