Invention Grant
- Patent Title: Isolating and correcting VPD data mismatch and/or corruption
- Patent Title (中): 隔离和纠正VPD数据不匹配和/或损坏
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Application No.: US14156639Application Date: 2014-01-16
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Publication No.: US09075715B2Publication Date: 2015-07-07
- Inventor: Ashish Batwara
- Applicant: LSI Corporation
- Applicant Address: SG Singapore
- Assignee: AVAGO TECHNOLOGIES GENERAL IP (SINGAPORE) PTE. LTD.
- Current Assignee: AVAGO TECHNOLOGIES GENERAL IP (SINGAPORE) PTE. LTD.
- Current Assignee Address: SG Singapore
- Agency: Sheridan Ross P.C.
- Main IPC: G06F11/00
- IPC: G06F11/00 ; G06F11/07 ; G06F11/16 ; G06F11/20
Abstract:
Disclosed is a method of detecting a product data error in a storage system. First and second vital product data (VPD) EEPROMs are read. Indicators of whether wither or both reads failed are received. Based on these indicators, the contents of the VPD EEPROMs may be compared. Based on a result of the comparing indicating a match, an arbitrary one of the VPD EEPROMS is used. Based on an indicator indicating an error with the first VPD EEPROM, the second VPD EEPROM is used.
Public/Granted literature
- US20140136885A1 ISOLATING AND CORRECTING VPD DATA MISMATCH AND/OR CORRUPTION Public/Granted day:2014-05-15
Information query
