Invention Grant
- Patent Title: Clamp circuit and method for clamping voltage
- Patent Title (中): 钳位电路和钳位电压的方法
-
Application No.: US13841820Application Date: 2013-03-15
-
Publication No.: US09077324B2Publication Date: 2015-07-07
- Inventor: Lei Huang , Eric Li
- Applicant: Fairchild Semiconductor Corporation
- Applicant Address: US CA San Jose
- Assignee: Fairchild Semiconductor Corporation
- Current Assignee: Fairchild Semiconductor Corporation
- Current Assignee Address: US CA San Jose
- Agency: Schwegman Lundberg & Woessner, P.A.
- Priority: CN201210069342 20120315
- Main IPC: H03K5/08
- IPC: H03K5/08

Abstract:
The disclosure provides a clamp circuit and a method for clamping voltage. The clamp circuit includes: a first switch control unit, connected with the high-potential terminal of the first stage output of a comparator and configured to clamp the voltage of the high-potential terminal to VGate1 when the voltage of the high-potential terminal is lower than a first pre-set value V1, and a second switch control unit, connected to the low-potential terminal of the first stage output of the comparator and configured to clamp the voltage of the low-potential terminal to VGate2 when the voltage of the low-potential terminal is higher than a second pre-set value V2, wherein the voltages of the first stage output of the comparator are between VGND and VCC. By the disclosure, the output voltage swings of the first stage of the comparator are limited, and thereby the processing speed of the comparator is improved.
Public/Granted literature
- US20130285730A1 CLAMP CIRCUIT AND METHOD FOR CLAMPING VOLTAGE Public/Granted day:2013-10-31
Information query
IPC分类: