Invention Grant
- Patent Title: Cathode operating temperature adjusting method, and writing apparatus
- Patent Title (中): 阴极工作温度调节方法和书写装置
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Application No.: US14186366Application Date: 2014-02-21
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Publication No.: US09082586B2Publication Date: 2015-07-14
- Inventor: Nobuo Miyamoto
- Applicant: NuFlare Technology, Inc.
- Applicant Address: JP Yokohama
- Assignee: NuFlare Technology, Inc.
- Current Assignee: NuFlare Technology, Inc.
- Current Assignee Address: JP Yokohama
- Agency: Oblon, McClelland, Maier & Neustadt, L.L.P.
- Priority: JP2013-036257 20130226
- Main IPC: H01J37/304
- IPC: H01J37/304 ; H01J37/317 ; H01J3/26 ; H01J37/07 ; H01J37/06 ; B82Y10/00 ; B82Y40/00

Abstract:
A cathode operating temperature adjusting method includes acquiring an approximate equation approximating a correlation between an emission current value in an electron beam source using a cathode and an operating temperature of the cathode at which a bias voltage becomes saturated at the emission current, measuring a current density of an electron beam from the cathode when in the state where an n-th emission current value and an n-th cathode operating temperature are set in the electron beam source, determining whether the measured current density is within a first tolerance range, changing the n-th emission current value to an (n+1)th emission current value when the measured current density is not within the first tolerance range, calculating an operating temperature of the cathode corresponding to the (n+1)th emission current value by the approximate equation, and setting the calculated operating temperature, as an (n+1)th cathode operating temperature, in the electron beam source.
Public/Granted literature
- US20140239200A1 CATHODE OPERATING TEMPERATURE ADJUSTING METHOD, AND WRITING APPARATUS Public/Granted day:2014-08-28
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